产品系列

罗斌森
  • SN74BCT8374ANT

  • Manufacturer : Texas Instruments
    Packaging : Tube
    Series : 74BCT
    Part Status : Obsolete
    Logic Type : Scan Test Device with D-Type Edge-Triggered Flip-Flops
    Supply Voltage : 4.5V ~ 5.5V
    Number of Bits : 8
    Operating Temperature : 0°C ~ 70°C
    Mounting Type : Through Hole
    Package / Case : 24-DIP (0.300", 7.62mm)
    Supplier Device Package : 24-PDIP

极速报价

型号
品牌 封装 批号 查看
SN75C3243DBR TI 28-SSOP New 详细
AWR1642BOOST-ODS TI New 详细
CD4051BQPWRG4Q1 TI 16-TSSOP New 详细
LM5001IDRQ1 TI 8-SOIC New 详细
LDC2112YFDT TI 16-DSBGA New 详细
LP38692SD-5.0/NOPB TI 6-WSON (3x3) New 详细
LM224J TI 14-CDIP New 详细
REG103FA-A/500E3 TI DDPAK/TO-263-5 New 详细
TSC2013EVM TI New 详细
ADS7253IRTET TI 16-WQFN (3x3) New 详细
78SR112SC TI New 详细
LM3S9B95-IBZ80-C1 TI 108-BGA (10x10) New 详细
LMC6574BIM/NOPB TI 14-SOIC New 详细
LX4F232H5QCFIGB0 TI 100-LQFP (14x14) New 详细
LM2619ATLX/NOPB TI 10-TμSMD (2.25x2.5) New 详细
INA157UA TI 8-SOIC New 详细
CD74HCT299M96 TI 20-SOIC New 详细
LM3554TMEEV/NOPB TI New 详细
LM4132EMF-2.0 TI SOT-23-5 New 详细
UCD74106RGMT TI 13-VQFN (3x3) New 详细